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Více informací o knize X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

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Anotace knihy

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Physics Materials / States of matter

• Plný název: X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
• Autor: Martin Schmidbauer
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 204
• EAN: 9783642057694
• ISBN: 3642057691
• ID: 01651105
• Nakladatelství: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnost: 338 g
• Rozměry: 12 × 156 × 12 mm
• Datum vydání: 01. December 2010

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