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Více informací o knize VLSI Design and Test

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• Anotace
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Anotace knihy

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: VLSI Design and Test
• Podnázev: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
• Autor: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 815
• EAN: 9789811074691
• ISBN: 9811074690
• ID: 18381771
• Nakladatelství: Springer Verlag, Singapore
• Hmotnost: 1264 g
• Rozměry: 235 × 155 × 50 mm
• Datum vydání: 22. December 2017

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