Mohlo by se vám také líbit

Více informací o knize Soft Error Mechanisms, Modeling and Mitigation

• Parametry knihy
• Anotace
• Oblíbené z jiného soudku

Nákupem získáte 118 bodů

Anotace knihy

This§book introduces readers to various radiation soft-error mechanisms such as soft§delays, radiation induced clock jitter and pulses, and single event (SE)§coupling induced effects. In addition to discussing various radiation hardening§techniques for combinational logic, the author also describes new mitigation§strategies targeting commercial designs. Coverage includes novel soft error§mitigation techniques such as the Dynamic Threshold Technique and Soft Error§Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE§crosstalk noise, delay and speed-up effects. Various mitigation strategies to§eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low§power energy-efficient designs and the impact of leakage power consumption§optimizations on soft error robustness. The author presents an analysis of various power optimization techniques,§enabling readers to make design choices that reduce static power consumption§and improve soft error reliability at the same time. §§

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Soft Error Mechanisms, Modeling and Mitigation
• Autor: Selahattin Sayil
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 105
• EAN: 9783319306063
• ISBN: 3319306065
• ID: 02926232
• Nakladatelství: Springer International Publishing AG
• Hmotnost: 379 g
• Rozměry: 235 × 155 × 13 mm
• Datum vydání: 25. February 2016

Oblíbené z jiného soudku

---

---

---