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Více informací o knize Advances in Imaging and Electron Physics

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Anotace knihy

Advances in Imaging and Electron Physics merges two long-running serials-- Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy . §This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.§Contributions from leading international scholars and industry experts §Discusses hot topic areas and presents current and future research trends §Invaluable reference and guide for physicists, engineers and mathematicians

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Mechanical engineering & materials Mechanical engineering

• Plný název: Advances in Imaging and Electron Physics
• Podnázev: Silicon-Based Millimetre-wave Technology
• Autor: Jamal Deen
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 484
• EAN: 9780123942982
• ISBN: 0123942985
• ID: 01198014
• Nakladatelství: Elsevier Science Publishing Co Inc
• Hmotnost: 760 g
• Rozměry: 229 × 152 mm
• Datum vydání: 27. November 2012

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