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Více informací o knize Semiconductor Material and Device Characterization 3e

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• Anotace
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Anotace knihy

Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Semiconductor Material and Device Characterization 3e
• Autor: Dieter K. Schroder
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 800
• EAN: 9780471739067
• ISBN: 0471739065
• ID: 01389606
• Nakladatelství: John Wiley & Sons Inc
• Hmotnost: 1324 g
• Rozměry: 238 × 243 × 51 mm
• Datum vydání: 11. January 2006

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