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Anotace knihy

Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semi-conductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.§

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Plný název: Scanning Tunneling Microscopy and Its Application
• Autor: Chunli Bai
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 370
• EAN: 9783540657156
• ISBN: 3540657150
• ID: 01566921
• Nakladatelství: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnost: 1600 g
• Rozměry: 234 × 156 × 19 mm
• Datum vydání: 10. August 2000

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