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Anotace knihy

This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Plný název: Scanning Force Microscopy
• Podnázev: With Applications to Electric, Magnetic and Atomic Forces
• Autor: Dror Sarid
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 282
• EAN: 9780195092042
• ISBN: 019509204X
• ID: 04513446
• Nakladatelství: Oxford University Press Inc
• Hmotnost: 667 g
• Rozměry: 242 × 161 × 21 mm
• Datum vydání: 20. October 1994

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