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Anotace knihy

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide- semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
• Autor: Daniel M. Fleetwood
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 348
• EAN: 9789812389404
• ISBN: 9812389407
• ID: 05067835
• Nakladatelství: World Scientific Publishing Co Pte Ltd
• Hmotnost: 680 g
• Rozměry: 235 × 157 × 23 mm
• Datum vydání: 03. August 2004

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