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Anotace knihy

Advances in Imaging and Electron Physics, Volume 217 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matterInforms and updates on the latest developments in the field of imaging and electron physicsProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

Parametry knihy

Zařazení knihy Knihy v angličtině Computing & information technology Computer science Signal processing

• Plný název: Quantitative Atomic-Resolution Electron Microscopy
• Autor: Martin Hytch, Peter Hawkes
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 294
• EAN: 9780128246078
• ID: 33270887
• Nakladatelství: Elsevier Science Publishing Co Inc
• Hmotnost: 610 g
• Rozměry: 229 × 152 × 18 mm
• Datum vydání: 07. April 2021

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