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Více informací o knize Microscopy of Semiconducting Materials

• Parametry knihy
• Anotace
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Anotace knihy

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction.This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Science: general issues Scientific standards

• Plný název: Microscopy of Semiconducting Materials
• Podnázev: Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
• Autor: A.G. Cullis, John L. Hutchison
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 540
• EAN: 9783642068706
• ISBN: 3642068707
• ID: 01652071
• Nakladatelství: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnost: 1442 g
• Rozměry: 235 × 155 × 30 mm
• Datum vydání: 19. October 2010

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