Kód: 05357937
Microelectronic Reliability
Autor Emiliano Pollino
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance o ... celý popis
- Jazyk:
Angličtina - Vazba: Pevná
- Počet stran: 556
Nakladatelství: Artech House Publishers, 1989
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Anotace knihy
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
Parametry knihy
Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering
3765 Kč
- Plný název: Microelectronic Reliability
- Autor: Emiliano Pollino
- Jazyk: Angličtina
- Vazba: Pevná
- Počet stran: 556
- EAN: 9780890063507
- ISBN: 9780890063507
- ID: 05357937
- Nakladatelství: Artech House Publishers
- Hmotnost: 982 g
- Rozměry: 229 × 152 × 34 mm
- Datum vydání: 01. April 1989
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