Kód: 06694349
Helps to improve fundamentals and applications of various modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. This title intends ... celý popis
Nákupem získáte 1437 bodů
Helps to improve fundamentals and applications of various modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. This title intends to promote the measurement of samples while reducing the scattered background in the x-ray spectrum.
Zařazení knihy Knihy v angličtině Mathematics & science Chemistry Analytical chemistry
14367 Kč
Osobní odběr Praha, Brno a 12903 dalších
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