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Více informací o knize Electromigration

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Anotace knihy

Electromigration is a microscopic phenomenon §involving electric field-induced diffusion, which is §very relevant to damage in interconnections. A §common method for monitoring interconnection §degradation is through electrical resistance §measurements, which requires direct electrical §contact. It is desirable to develop non-contact §methods to monitor electromigration damage §formation. In this thesis, we propose a novel §Optical Microscopy Imaging Method (OMIM), and we §provide a theoretical description and experimental §results. OMIM not only provides a new method for §studying electromigration, but also provides a §useful method for studying other micro-devices and §materials in a non- contact mode.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Physics

• Plný název: Electromigration
• Podnázev: Studied with the Optical Microscopy Imaging Method
• Autor: Linghong Li
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 76
• EAN: 9783639088137
• ISBN: 3639088131
• ID: 06817951
• Nakladatelství: VDM Verlag Dr. Mueller E.K.
• Hmotnost: 113 g
• Rozměry: 229 × 152 × 4 mm
• Datum vydání: 10. October 2008

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