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Anotace knihy

The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
• Autor: Manoj Sachdev, José Pineda de Gyvez
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 328
• EAN: 9780387465463
• ISBN: 0387465464
• ID: 01382200
• Nakladatelství: Springer-Verlag New York Inc.
• Hmotnost: 694 g
• Rozměry: 235 × 155 × 24 mm
• Datum vydání: 04. June 2007

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