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Anotace knihy

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Debug Automation from Pre-Silicon to Post-Silicon
• Autor: Mehdi Dehbashi, Gorschwin Fey
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 171
• EAN: 9783319356105
• ISBN: 3319356100
• ID: 14208380
• Nakladatelství: Springer International Publishing AG
• Hmotnost: 3276 g
• Rozměry: 235 × 155 × 8 mm
• Datum vydání: 10. September 2016

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