Kód: 01650956
Applied Scanning Probe Methods I
Autor Bharat Bhushan, Harald Fuchs, Sumio Hosaka
This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces ... celý popis
- Jazyk:
Angličtina - Vazba: Brožovaná
- Počet stran: 476
Nakladatelství: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, 2010
- Více informací o knize
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Více informací o knize Applied Scanning Probe Methods I
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Anotace knihy
This book surveys near-field scanning probe techniques, covering static and dynamic force microscopies, including sensor technology and tip characterization. Details applications such as macro- and nanotribology, polymer surfaces and roughness investigations.
Parametry knihy
Zařazení knihy Knihy v angličtině Mathematics & science Chemistry Analytical chemistry
2533 Kč
- Plný název: Applied Scanning Probe Methods I
- Autor: Bharat Bhushan, Harald Fuchs, Sumio Hosaka
- Jazyk: Angličtina
- Vazba: Brožovaná
- Počet stran: 476
- EAN: 9783642056024
- ISBN: 3642056024
- ID: 01650956
- Nakladatelství: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
- Hmotnost: 842 g
- Rozměry: 22 × 156 × 31 mm
- Datum vydání: 06. December 2010
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