Mohlo by se vám také líbit

Více informací o knize A Novel approach for Fault Tolerant Nano Memory Applications

• Parametry knihy
• Anotace
• Oblíbené z jiného soudku

Nákupem získáte 91 bodů

Anotace knihy

NANOTECHNOLOGY provides smaller, faster, and lower energy devices which allow more powerful and compact circuitry; However, these benefits come with a cost-the nanoscale devices may be less reliable. Thermal- and shot-noise estimations alone suggest that the transient fault rate of an individual nanoscale device (e.g., transistor or nanowire) may be orders of magnitude higher than today's devices. A failure is said to have occurred in a circuit or system if it deviates from its specified behavior. A fault on the other hand is physical defect which may or may not cause a failure. The failure rate, also known as the hazard rate and defined as number of failures per unit time compared with the number of surviving components. A fault is characterized by its nature, value, extent & duration.

Parametry knihy

• Plný název: A Novel approach for Fault Tolerant Nano Memory Applications
• Autor: Chinnala Pavan Kumar
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 68
• EAN: 9783659894411
• ID: 13497762
• Nakladatelství: LAP Lambert Academic Publishing
• Hmotnost: 118 g
• Rozměry: 220 × 150 × 4 mm
• Rok vydání: 2016

Oblíbené z jiného soudku

---

---

---