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Anotace knihy

X-ray spectroscopy has emerged as a powerful tool in§research and in industrial laboratories. It is used in the§study of metals, semiconductors, amorphous solids, liquids§and gases. This comprehensive presentation develops the§subject from its basic principles and relates the theory to§experimental observations. The new edition includes topics§that have recently become important, for example, the X-ray§laser, appearance potential spectroscopy, synchrotron§radiation and EXAFS of high-Tc superconducting materials. A§thorough introduction, up to research level, isprovided to§EXAFS, which has seen rapid development in the past few§years. This textbook conveniently presents the principles,§applications and current techniques of X-ray spectroscopy,§which makes it ideal for graduate students beginning§research involving x-ray spectroscopy.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Chemistry Analytical chemistry

• Plný název: X-Ray Spectroscopy
• Podnázev: An Introduction
• Autor: Bipin K. Agarwal
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 421
• EAN: 9783540507192
• ISBN: 3540507191
• ID: 02301873
• Nakladatelství: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnost: 670 g
• Rozměry: 235 × 155 × 24 mm
• Datum vydání: 01. October 1991

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