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Anotace knihy

An understanding of mechanical behavior is crucial for a wide variety of thin-film technologies such as semiconductor devices and packaging (including advanced interconnects, dielectrics and silicides), information storage media, hard coatings, microelectromechanical systems (MEMS), and biomedical devices. The influence of mechanical behavior is seen in thin-film performance and reliability, as well as morphology development during processing and service. The increased need for understanding of these properties has challenged modern materials science because concepts, models and techniques developed for bulk materials often do not apply in small dimensions. This book addresses key issues in the still growing field of thin-film mechanical behavior. Topics include: multilayer thin films; metallic thin films; epitaxy, deposition parameters, microstructure and stresses; thin films for applications in MEMS; polymer thin films; mechanical properties of amorphous and crystalline carbon; adhesion and fracture; reliability in microelectronics; and nanoindentation and advanced testing techniques.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Thin Films – Stresses and Mechanical Properties VIII: Volume 594
• Autor: Richard VinciOliver KraftNeville MoodyPaul Besser
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 568
• EAN: 9781558995024
• ISBN: 1558995021
• ID: 02060232
• Nakladatelství: Cambridge University Press
• Hmotnost: 920 g
• Rozměry: 229 × 152 × 32 mm
• Datum vydání: 25. September 2000

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