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Více informací o knize Terrestrial Neutron-induced Soft Error In Advanced Memory Devices

• Parametry knihy
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Anotace knihy

Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

Parametry knihy

Zařazení knihy Knihy v angličtině Computing & information technology Computer hardware Storage media & peripherals

• Plný název: Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
• Autor: Takashi Nakamura, Mamoru Baba, Eishi Ibe
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 368
• EAN: 9789812778819
• ISBN: 9812778810
• ID: 05068958
• Nakladatelství: World Scientific Publishing Co Pte Ltd
• Hmotnost: 654 g
• Rozměry: 237 × 162 × 20 mm
• Datum vydání: 03. April 2008

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