Kód: 05068958
Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and qua ... celý popis
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Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
Zařazení knihy Knihy v angličtině Computing & information technology Computer hardware Storage media & peripherals
4507 Kč
Osobní odběr Praha, Brno a 12903 dalších
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