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Anotace knihy

This book, written by a pioneer in surface physics and thin film research and the inventor of Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM), covers these and other techniques for the imaging of surfaces with low energy (slow) electrons. These techniques also include Photoemission Electron Microscopy (PEEM), X-ray Photoemission Electron Microscopy (XPEEM), and their combination with microdiffraction and microspectroscopy, all of which use cathode lenses and slow electrons. Of particular interest are the fundamentals and applications of LEEM, PEEM, and XPEEM because of their widespread use. Numerous illustrations illuminate the fundamental aspects of the electron optics, the experimental setup, and particularly the application results with these instruments. Surface Microscopy with Low Energy Electrons will give the reader a unified picture of the imaging, diffraction, and spectroscopy methods that are possible using low energy electron microscopes.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Chemistry Analytical chemistry

• Plný název: Surface Microscopy with Low Energy Electrons
• Autor: Ernst Bauer
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 496
• EAN: 9781493939886
• ISBN: 1493939882
• ID: 14277196
• Nakladatelství: Springer-Verlag New York Inc.
• Hmotnost: 8662 g
• Rozměry: 235 × 155 × 20 mm
• Datum vydání: 17. September 2016

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