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Více informací o knize Sampling, Wavelets, and Tomography

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• Anotace
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Anotace knihy

Sampling, wavelets, and tomography are three active areas of contemporary mathematics sharing common roots that lie at the heart of harmonic and Fourier analysis. The advent of new techniques in mathematical analysis has strengthened their interdependence and led to some new and interesting results in the field. This state-of-the-art book not only presents new results in these research areas, but it also demonstrates the role of sampling in both wavelet theory and tomography. Aimed at mathematicians, scientists, and engineers working in signal and image processing and medical imaging, the work is designed to be accessible to an audience with diverse mathematical backgrounds. Although the volume reflects the contributions of renowned mathematicians and engineers, each chapter has an expository introduction writtenfor the non-specialist. One of the key features of the book is an introductory chapter stressing the interdependence of the three main areas covered.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Science: general issues Maths for scientists

• Plný název: Sampling, Wavelets, and Tomography
• Autor: John J. Benedetto, Ahmed I. Zayed
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 344
• EAN: 9780817643041
• ISBN: 0817643044
• ID: 01399348
• Nakladatelství: Birkhauser Boston Inc
• Hmotnost: 1540 g
• Rozměry: 235 × 155 × 25 mm
• Datum vydání: 10. December 2003

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