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Více informací o knize Reflection Electron Microscopy and Spectroscopy for Surface Analysis

• Parametry knihy
• Anotace
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Anotace knihy

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Mechanical engineering & materials Materials science

• Plný název: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
• Autor: Zhong Lin Wang
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 460
• EAN: 9780521017954
• ISBN: 0521017955
• ID: 02017914
• Nakladatelství: Cambridge University Press
• Hmotnost: 731 g
• Rozměry: 244 × 170 × 25 mm
• Datum vydání: 22. August 2005

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