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Více informací o knize Recent Advances in Logo Detection using Machine Learning Paradigms

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Anotace knihy

This book presents the current trends in deep learning-based object detection framework with a focus on logo detection tasks. It introduces a variety of approaches, including attention mechanisms and domain adaptation for logo detection, and describes recent advancement in object detection frameworks using deep learning. We offer solutions to the major problems such as the lack of training data and the domain-shift issues.This book provides numerous ways that deep learners can use for logo recognition, including:Deep learning-based end-to-end trainable architecture for logo detectionWeakly supervised logo recognition approach using attention mechanismsAnchor-free logo detection framework combining attention mechanisms to precisely locate logos in the real-world imagesUnsupervised logo detection that takes into account domain-shift issues from synthetic to real-world imagesApproach for logo detection modelingdomain adaption task in the context of weakly supervised learning to overcome the lack of object-level annotation problem.The merit of our logo recognition technique is demonstrated using experiments, performance evaluation, and feature distribution analysis utilizing different deep learning frameworks.The book is directed to professors, researchers, practitioners in the field of engineering, computer science, and related fields as well as anyone interested in using deep learning techniques and applications in logo and various object detection tasks.   

Parametry knihy

Zařazení knihy Knihy v angličtině Computing & information technology Databases

• Plný název: Recent Advances in Logo Detection using Machine Learning Paradigms
• Podnázev: Theory and Practice
• Autor: Yen-Wei Chen, Xiang Ruan, Rahul Kumar Jain
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 160
• EAN: 9783031598104
• ID: 45533791
• Nakladatelství: Springer, Berlin
• Hmotnost: 339 g
• Rozměry: 235 × 155 mm
• Datum vydání: 09. July 2024

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