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Více informací o knize Progress in Nanoscale Characterization and Manipulation

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• Anotace
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Anotace knihy

This book focuses on charged-particle optics and microscopy, as well as their applications in the materials sciences. Presenting a range of cutting-edge theoretical and methodological advances in electron microscopy and microanalysis, and examining their crucial roles in modern materials research, it offers a unique resource for all researchers who work in ultramicroscopy and/or materials research. The book addresses the growing opportunities in this field and introduces readers to the state of the art in charged-particle microscopy techniques. It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy. Covering these and other essential topics, the book is intended to facilitate the development of microscopy techniques, inspire young researchers, and make a valuable contribution to the field.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Chemistry Analytical chemistry

• Plný název: Progress in Nanoscale Characterization and Manipulation
• Autor: Xuedong Bai, Jing Tao, Chen Wang, Rongming Wang, Hongzhou Zhang
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 508
• EAN: 9789811304538
• ISBN: 981130453X
• ID: 19346832
• Nakladatelství: Springer Verlag, Singapore
• Hmotnost: 934 g
• Rozměry: 235 × 155 × 30 mm
• Datum vydání: 14. September 2018

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