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Více informací o knize Modeling Nanoscale Imaging in Electron Microscopy

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Anotace knihy

Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Plný název: Modeling Nanoscale Imaging in Electron Microscopy
• Autor: Thomas Vogt, Wolfgang Dahmen, Peter G. Binev
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 182
• EAN: 9781461421900
• ISBN: 146142190X
• ID: 01427170
• Nakladatelství: Springer-Verlag New York Inc.
• Hmotnost: 459 g
• Rozměry: 235 × 155 × 14 mm
• Datum vydání: 02. March 2012

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