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Více informací o knize Kelvin Probe Force Microscopy

• Parametry knihy
• Anotace
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Anotace knihy

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Physics Thermodynamics & heat

• Plný název: Kelvin Probe Force Microscopy
• Podnázev: Measuring and Compensating Electrostatic Forces
• Autor: Sascha Sadewasser, Thilo Glatzel
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 334
• EAN: 9783642225659
• ISBN: 3642225659
• ID: 01658439
• Nakladatelství: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnost: 656 g
• Rozměry: 242 × 162 × 25 mm
• Datum vydání: 21. October 2011

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