Kód: 06698114
Integrated Circuit Quality and Reliability
Autor Eugene R. Hnatek
Examines various aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This work discusses: circuit design technology trends; sources of error in wafer fabricatio ... celý popis
- Jazyk:
Angličtina - Vazba: Pevná
- Počet stran: 808
Nakladatelství: Taylor & Francis Inc, 1994
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6246 Kč
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Anotace knihy
Examines various aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This work discusses: circuit design technology trends; sources of error in wafer fabrication and assembly; avenues of contamination; IC packaging methods; and, in-line process monitors and test structures.
Parametry knihy
Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Mechanical engineering & materials Production engineering
6246 Kč
- Plný název: Integrated Circuit Quality and Reliability
- Autor: Eugene R. Hnatek
- Jazyk: Angličtina
- Vazba: Pevná
- Počet stran: 808
- EAN: 9780824792831
- ISBN: 9780824792831
- ID: 06698114
- Nakladatelství: Taylor & Francis Inc
- Hmotnost: 1288 g
- Rozměry: 165 × 239 × 42 mm
- Datum vydání: 01. December 1994
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