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Více informací o knize Defect Detection via THz Imaging

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Anotace knihy

Until recent years, terahertz waves were an§undiscovered, or most importantly, an unexploited§area of electromagnetic spectrum. Recent advances in§hardware have started to open up the eld to new§applications such as THz imaging. This non§destructive technology can penetrate through diverse§material such that the internal structure which is§invisible to other imaging modalities, can be§visualized. However, automated processing of THz§images can be quite challenging. Low contrast and the§presence of a widely unknown type of noise make the§analysis of these images difficult. Therefore,§pre-processing techniques are required for further§investigations.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Physics Electricity, electromagnetism & magnetism

• Plný název: Defect Detection via THz Imaging
• Podnázev: Potentials and Limitations
• Autor: Kaveh Houshmand
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 88
• EAN: 9783639103694
• ISBN: 3639103696
• ID: 06819352
• Nakladatelství: VDM Verlag
• Hmotnost: 127 g
• Rozměry: 229 × 152 × 5 mm
• Datum vydání: 06. November 2008

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