Mohlo by se vám také líbit

Více informací o knize Control Charts and Machine Learning for Anomaly Detection in Manufacturing

• Parametry knihy
• Anotace
• Oblíbené z jiného soudku

Nákupem získáte 539 bodů

Anotace knihy

This book introduces the latest research on advanced control charts and new machine learning approaches to detect abnormalities in the smart manufacturing process. By approaching anomaly detection using both statistics and machine learning, the book promotes interdisciplinary cooperation between the research communities, to jointly develop new anomaly detection approaches that are more suitable for the 4.0 Industrial Revolution.The book provides ready-to-use algorithms and parameter sheets, enabling readers to design advanced control charts and machine learning-based approaches for anomaly detection in manufacturing. Case studies are introduced in each chapter to help practitioners easily apply these tools to real-world manufacturing processes.The book is of interest to researchers, industrial experts, and postgraduate students in the fields of industrial engineering, automation, statistical learning, and manufacturing industries.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Mechanical engineering & materials Production engineering

• Plný název: Control Charts and Machine Learning for Anomaly Detection in Manufacturing
• Autor: Kim Phuc Tran
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 269
• EAN: 9783030838218
• ID: 41363396
• Nakladatelství: Springer, Berlin
• Hmotnost: 423 g
• Rozměry: 235 × 155 × 16 mm
• Rok vydání: 2022

Oblíbené z jiného soudku

---

---

---