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Více informací o knize Ab Initio Modelling of Scanning Tunneling Spectroscopy and Microscopy

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Anotace knihy

Scanning tunneling microscopy (STM) is one of the most powerful and established state-of-the-art techniques to characterize surface properties at nano-scale. Despite the power of the STM, in most cases experiments require complementary theoretical modeling in order to achieve an unambiguous understanding of the studied systems. Therefore it has become a gold standard nowadays to combine experimental and theoretical STM studies. This book provides an insight into the most popular first-principles modeling approach for STM in which the transfer Hamiltonian formalism and density functional theory (DFT) are combined. A step-by-step overview of DFT and the theory of STM methods is followed by examples of their application. Two different cases of hitherto not understood STM and Fourier-transformed STM experiments on magnetic and nonmagnetic metallic surfaces are discussed. A detailed theoretical explanation of these results is presented.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Physics

• Plný název: Ab Initio Modelling of Scanning Tunneling Spectroscopy and Microscopy
• Autor: Alexey Dick
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 232
• EAN: 9783639365535
• ISBN: 3639365534
• ID: 06843385
• Nakladatelství: VDM Verlag
• Hmotnost: 345 g
• Rozměry: 229 × 152 × 13 mm
• Datum vydání: 02. September 2011

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