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Anotace knihy

This book offers a genuinely practical introduction to the most commonly encountered optical and non-optical systems used for the metrology and characterization of surfaces, including guidance on best practice, calibration, advantages and disadvantages, and interpretation of results. It enables the user to select the best approach in a given context.Most methods in surface metrology are based upon the interaction of light or electromagnetic radiation (UV, NIR, IR), and different optical effects are utilized to get a certain optical response from the surface; some of them record only the intensity reflected or scattered by the surface, others use interference of EM waves to obtain a characteristic response from the surface. The book covers techniques ranging from microscopy (including confocal, SNOM and digital holographic microscopy) through interferometry (including white light, multi-wavelength, grazing incidence and shearing) to spectral reflectometry and ellipsometry. The non-optical methods comprise tactile methods (stylus tip, AFM) as well as capacitive and inductive methods (capacitive sensors, eddy current sensors).

Parametry knihy

Zařazení knihy Knihy v němčině Naturwissenschaften, Medizin, Informatik, Technik Technik Maschinenbau, Fertigungstechnik

• Plný název: Practical Guide to Surface Metrology
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 256
• EAN: 9783030294564
• ISBN: 3030294560
• ID: 37026987
• Nakladatelství: Springer Nature Switzerland AG
• Hmotnost: 394 g
• Rozměry: 235 × 155 × 15 mm
• Datum vydání: 26. August 2021

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