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Anotace knihy

This title is a comprehensive collection of atomic characteristics of highly charged ion sources and elementary processes related to X-ray radiation: energy levels, wavelengths, transition probabilities, cross sections and rate coefficients. Many figures, tables, simple formulas and scaling laws accompany the text wherever possible.X-Ray Radiation of Highly Charged Ions is a comprehensive collection of atomic characteristics of highly charged ion (HCI) sources and elementary processes related to X-ray radiation: energy levels, wavelengths, transition probabilities, cross sections, and rate coefficients. The material covers a broad range of elementary processes occuring in hot laboratory and astrophysical plasmas: radiative and dielectronic recombination, radiative electron capture, radiation transfer and excitation, and others. The book comprises a large amount of figures, tables, simple formulas, and if possible scaling laws for radiative and collisional characteristics of HCI. The data presented is useful for specialists who deal with X-ray spectroscopy, physics of HCI, heavy-particle collisions, and thermonuclear fusion.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Physics Particle & high-energy physics

• Plný název: X-Ray Radiation of Highly Charged Ions
• Autor: Heinrich F. Beyer, H.-J. Kluge, V.P. Shevelko
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 233
• EAN: 9783642083235
• ISBN: 3642083234
• ID: 01653343
• Nakladatelství: Springer, Berlin
• Hmotnost: 385 g
• Rozměry: 235 × 157 × 13 mm
• Rok vydání: 2010

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