Kód: 12446872
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metr ... celý popis
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This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.
Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Technology: general issues Instruments & instrumentation engineering
3059 Kč
Osobní odběr Praha, Brno a 12903 dalších
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