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Anotace knihy

This book provides readers with an insightful guide to the design, testing and optimization of 2.5D integrated circuits. The authors describe a set of design-for-test methods to address various challenges posed by the new generation of 2.5D ICs, including pre-bond testing of the silicon interposer, at-speed interconnect testing, built-in self-test architecture, extest scheduling, and a programmable method for low-power scan shift in SoC dies. This book covers many testing techniques that have already been used in mainstream semiconductor companies. Readers will benefit from an in-depth look at test-technology solutions that are needed to make 2.5D ICs a reality and commercially viable.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Testing of Interposer-Based 2.5D Integrated Circuits
• Autor: Ran Wang, Krishnendu Chakrabarty
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 182
• EAN: 9783319547138
• ISBN: 3319547135
• ID: 15822899
• Nakladatelství: Springer International Publishing AG
• Hmotnost: 4203 g
• Rozměry: 235 × 155 × 13 mm
• Datum vydání: 29. March 2017

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