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Více informací o knize Surface plasmons resonance spectroscopy

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Anotace knihy

The diverse applications of surface plasmons resonance spectroscopy are well know and understood. X-ray spectroscopy has proven to be one of the most useful tools in the study of thin filmm. The lateral electron density variation within a thin film (measured using x-ray spectroscopy) and the dielectric constant variation of the thin film (investigated using surface plasmons resonance spectroscopy) are however linearly related to one onother. It is in the light of the linearity between these two pyzsical quantities that prompted us to combine both spectroscopic analysis processes in one device. In this way it was posible to use the results obtain from x-ray reflectivity and work back to verify the results obtain from the surface plasmons resonance scans. This was realise for static s well as for dynamic processes within a thin film of polymer.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Astronomy, space & time

• Plný název: Surface plasmons resonance spectroscopy
• Autor: Felix Ntui Ayuk
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 120
• EAN: 9783838128375
• ISBN: 3838128370
• ID: 07028429
• Nakladatelství: Sudwestdeutscher Verlag Fur Hochschulschriften AG
• Hmotnost: 192 g
• Rozměry: 154 × 228 × 14 mm
• Datum vydání: 01. September 2011

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