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Více informací o knize Single Electron Spin Measurements in Submicron Si MOS-FETs Random Telegraph Signal, Single Electron Spin Resonance

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Anotace knihy

Presented is our measurements of a single electronic§spin in the gate oxide of submicron-size silicon§field effect transistors. Defects near the silicon§and silicon dioxide interface have profound effects§on the transistor conduction properties. For a§submicron transistor, there might be only one§isolated trap state that is within a proper tunneling§distance regarding to both the coordinate and energy.§We have studied the statistics and dynamics of§individual defects extensively by random telegraph§signal (RTS), the stochastic switching of the channel§conductivity due to the trapping of single channel§electrons by the defect. We also have, for the first§time, studied the spin properties of these individual§defects. By investigating the dependence of RTS§statistics on a§plane magnetic field, we have identified spin states§of a single electron on a defect. Using microwave§radiation of frequencies ranging from 16 - 50 GHz, we§have detected magnetic resonance of a single electron§spin. The trap occupancy or channel current changes§at the electron spin resonance condition, with a§g-factor of 2.02+-0.015.

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Zařazení knihy Knihy v angličtině Mathematics & science Physics

• Plný název: Single Electron Spin Measurements in Submicron Si MOS-FETs Random Telegraph Signal, Single Electron Spin Resonance
• Autor: Ming Xiao
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 124
• EAN: 9783836493758
• ISBN: 3836493756
• ID: 07158931
• Nakladatelství: VDM Verlag
• Hmotnost: 204 g
• Rozměry: 151 × 226 × 11 mm
• Datum vydání: 16. December 2008

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