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Více informací o knize Reliability, Robustness and Failure Mechanisms of LED Devices

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Anotace knihy

Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation presents several methods to determine the reliability of infrared LEDs. The book focuses on the method to extract fundamental parameters from electrical and optical characterizations. The authors identify different parameters related to specific zones in components and then extract failure mechanisms based on measured performance-before and after aging tests. The knowledge of failure mechanisms allows you to extract degradation laws related to a physics equation so an accurate lifetime distribution can then be proposed. Deals exclusively with reliability, based on the physics of failure for infrared LEDsIdentifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applicationsUses a complete methodology to reduce the number of samples needed to estimate lifetime distributionFocuses on the method to extract fundamental parameters from electrical and optical characterizations

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: Reliability, Robustness and Failure Mechanisms of LED Devices
• Podnázev: Methodology and Evaluation
• Autor: Yannick Deshayes, Laurent BĂ©chou
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 172
• EAN: 9781785481529
• ISBN: 1785481525
• ID: 02984068
• Nakladatelství: ISTE Press Ltd - Elsevier Inc
• Hmotnost: 432 g
• Rozměry: 238 × 158 × 15 mm
• Datum vydání: 23. September 2016

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