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Anotace knihy

To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion-of IoT-from a quality testing viewpoint. You'll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you'll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test lab architecture environments and how to automate IoT tests. There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems. What You Will LearnUnderstand IoT software test architecture and planningMaster IoT security testing and test techniquesStudy IoT test lab automation and architecturesReview the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V Who This Book Is ForReaders with basic knowledge of software developers who want to learn more about IoT testing and its intricacies, as well as companies moving into the domain of IoT, and even those already deep into the IoT domain will benefit from this book.

Parametry knihy

Zařazení knihy Knihy v angličtině Computing & information technology Computer security

• Plný název: IoT System Testing
• Podnázev: An IoT Journey from Devices to Analytics and the Edge
• Autor: Jon Duncan Hagar
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 326
• EAN: 9781484282755
• ID: 39120883
• Nakladatelství: APress
• Hmotnost: 666 g
• Rozměry: 176 × 252 × 29 mm
• Datum vydání: 17. September 2022

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