Mohlo by se vám také líbit

Více informací o knize High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip

• Parametry knihy
• Anotace
• Oblíbené z jiného soudku

Nákupem získáte 331 bodů

Anotace knihy

This book introduces a novel framework for accurately modeling the errors in nanoscale technology and developing a smooth tool flow at high-level design abstractions to estimate error effects, which aids the development of high-level fault-tolerant techniques. In total, the book presents 6 solutions for reliability estimation (3 for fault injection and 3 for analytical estimation) and 5 techniques for reliability exploration (3 for architectural level and 2 for system-level). It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures.§§

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Plný název: High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip
• Autor: Zheng Wang, Anupam Chattopadhyay
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 197
• EAN: 9789811010729
• ISBN: 9811010722
• ID: 02976144
• Nakladatelství: Springer Verlag, Singapore
• Hmotnost: 4557 g
• Rozměry: 235 × 155 × 18 mm
• Datum vydání: 05. July 2017

Oblíbené z jiného soudku

---

---

---