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Anotace knihy

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Chemistry Analytical chemistry

• Plný název: Field Emission Scanning Electron Microscopy
• Autor: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 137
• EAN: 9789811044328
• ISBN: 9811044325
• ID: 16018571
• Nakladatelství: Springer Verlag, Singapore
• Hmotnost: 252 g
• Rozměry: 159 × 240 × 13 mm
• Datum vydání: 06. October 2017

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