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Více informací o knize Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

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Anotace knihy

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Plný název: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
• Autor: S J B Reed
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 232
• EAN: 9780521848756
• ISBN: 052184875X
• ID: 04095600
• Nakladatelství: Cambridge University Press
• Hmotnost: 584 g
• Rozměry: 255 × 182 × 15 mm
• Datum vydání: 25. August 2005

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