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Více informací o knize Atomic Force Microscopy/Scanning Tunneling Microscopy 3

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• Anotace
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Anotace knihy

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Plný název: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
• Autor: Samuel H. Cohen, Marcia L. Lightbody
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 210
• EAN: 9780306462979
• ISBN: 0306462974
• ID: 01379186
• Nakladatelství: Springer Science+Business Media
• Hmotnost: 635 g
• Rozměry: 254 × 178 × 20 mm
• Datum vydání: 31. December 1999

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