Kód: 06671236
Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. This volume contains the papers on ... celý popis
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Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. This volume contains the papers on AFM techniques.
Zařazení knihy Knihy v angličtině Mathematics & science Science: general issues Scientific equipment, experiments & techniques
11496 Kč
Osobní odběr Praha, Brno a 12903 dalších
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