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Anotace knihy

A textbook for the advanced undergraduate or graduate student beginning a serious study of X-ray crystallography. It will be of interest both to those intending to become professional crystallographers and to those physicists, chemists, biologists, geologists, metallurgists and others who will use it as a tool in their research. All major aspects of crystallography are covered - the geometry of crystals and their symmetry, theoretical and practical aspects of diffracting X-rays by crystals and how the data may be analysed to find the symmetry of the crystal and its structure. Recent advances are fully covered, including the synchrotron as a source of X-rays, methods of solving structures from power data and the full range of techniques for solving structures from single-crystal data. A suite of computer programs is provided for carrying out many operations of data-processing and solving crystal structures - including by direct methods. While these are limited to two dimensions they fully illustrate the characteristics of three-dimensional work. These programs are required for many of the examples given at the end of each chapter but may also be used to create new examples by which students can test themselves or each other.

Parametry knihy

Zařazení knihy Knihy v angličtině Mathematics & science Physics Materials / States of matter

• Plný název: Introduction to X-ray Crystallography
• Autor: Michael M. Woolfson
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 416
• EAN: 9780521423595
• ISBN: 0521423597
• ID: 02030381
• Nakladatelství: Cambridge University Press
• Hmotnost: 740 g
• Rozměry: 247 × 187 × 22 mm
• Datum vydání: 13. January 1997

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