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Anotace knihy

Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contains contributions from leading authorities on the subject matterInforms and updates on all the latest developments in the field of imaging and electron physicsProvides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resourceFeatures extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science. and digital image processing

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Other technologies & applied sciences Applied optics

• Plný název: Advances in Imaging and Electron Physics
• Autor: Peter W. Hawkes
• Jazyk: Angličtina
• Vazba: Pevná
• Počet stran: 342
• EAN: 9780128022535
• ISBN: 9780128022535
• ID: 09409179
• Nakladatelství: Elsevier Science Publishing Co Inc
• Hmotnost: 700 g
• Rozměry: 229 × 152 × 24 mm
• Datum vydání: 21. August 2015

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