Kód: 22569070
Abstract: A process-based model (UFET) for deep-submicron bulk-silicon MOSFETs is developed and verified with numerical device simulations and measured data. The charge-based model is physical with accountings for the predominant ... celý popis
Nákupem získáte 262 bodů
Abstract: A process-based model (UFET) for deep-submicron bulk-silicon MOSFETs is developed and verified with numerical device simulations and measured data. The charge-based model is physical with accountings for the predominant short-channel (e.g., c
Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Energy technology & engineering Electrical engineering
2617 Kč
Osobní odběr Praha, Brno a 12903 dalších
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