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Více informací o knize Fundamentals Of Atomic Force Microscopy - Part I: Foundations

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Anotace knihy

The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM.

Parametry knihy

Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Technology: general issues Nanotechnology

• Plný název: Fundamentals Of Atomic Force Microscopy - Part I: Foundations
• Autor: Ronald G. Reifenberger
• Jazyk: Angličtina
• Vazba: Brožovaná
• Počet stran: 340
• EAN: 9789814630351
• ISBN: 9789814630351
• ID: 03611607
• Nakladatelství: World Scientific Publishing
• Hmotnost: 492 g
• Rozměry: 155 × 229 × 19 mm
• Datum vydání: 12. November 2015

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