Kód: 05357937
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance o ... celý popis
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A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
Zařazení knihy Knihy v angličtině Technology, engineering, agriculture Electronics & communications engineering
4660 Kč
Osobní odběr Praha, Brno a 12903 dalších
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